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DriveAFM

  • 品牌:Nanosurf
  • 型號:DriveAFM

Performance without compromise

The DriveAFM, Nanosurf‘s new flagship instrument, utilizes the latest technology to deliver stable, high-end performance. It was designed to fulfill the needs of top notch research, today and in the future.

 CleanDrive: stable excitation in air and liquid
 Ultra-low noise
 Direct drive: high-resolution imaging and large scan area
 Fully motorized system: full control via software



 
 

DriveAFM for biology and life sciences

The DriveAFM plays out all its advantages when it comes to biological applications. The full motorization allows adjusting the lasers and photodetector, and navigating the sample, without interfering with a temperature-controlled environment. CleanDrive excitation provides reliable and clean cantilever tuning in liquid environments. The insensitivity of the CleanDrive towards environmental changes and the sensitivity of small cantilevers facilitate imaging of delicate samples over long periods of time with ease.

Seamless integration of the DriveAFM with an inverted optical microscope allows transmitted light and fluorescence microscopy to be combined with AFM imaging and force spectroscopy. The light sources‘ wavelengths used for CleanDrive (785 nm) and the deflection detection (840 nm) were selected to avoid interference with biological samples and to make fluorescence imaging possible.




DriveAFM for materials science

The DriveAFM combines performance and a wide range of applications important for material science research. Its unique direct drive tip scanner technology paired with CleanDrive are key for fast and stable operation in air and liquid. The tip scanner design makes the performance of the DriveAFM independent of the mass of the sample under investigation also allowing measurement on heavy samples. The full motorization not only simplifies working with the system but also facilitates automated measurements addressing different areas of a sample.

Besides reliable topographic imaging, the DriveAFM also features a complete set of different modes to investigate the nanoelectrical (e.g. C-AFM, KPFM, or PFM) or nanomechanical properties of your sample. The universe of accessories available for the DriveAFM offers extended functionality such as heating or cooling the sample, applying a variable magnetic field, detecting low electrical currents or investigating with in situ AFM imaging the changes taking place on electrodes during electrochemical processes.



 


DriveAFM imaging modes

This overview shows which modes the instrument is capable of. Some modes may require additional components or software options. For details, please view the brochure or contact us directly.

Standard imaging modes

Static Force Mode
Lateral Force Mode
Dynamic Force Mode (Tapping Mode)
Phase Imaging Mode
 

Magnetic properties

Magnetic Force Microscopy

Electrical properties

Conductive AFM (C-AFM)
Piezoelectric Force Microscopy (PFM)
Electrostatic Force Microscopy (EFM)
Kelvin Probe Force Microscopy (KPFM)
 

Mechanical properties


Force Spectroscopy
Force Modulation
Stiffness and Modulus
Adhesion
Unfolding and Stretching
Force Mapping
Lithography and Nanomanipulation
Electrochemical AFM (EC-AFM)
 

System specifications

Scan head 
Scan sizetyp. typ. 100 μm x 100 μm x 20 μm
min. 95 μm x 95 μm x 18 μm
Read-out light source850 nm low-coherence SLD
CleanDrive light source785 nm laser
Photodetector bandwidth≥8 MHz
Standard / maximum sample size100 mm / 150 mm
Z-height noise dynamic<30 pm (RMS)
Z-height noise static<30 pm (RMS)
DC detector noise*<5 pm (RMS, 0.1 Hz – 10 kHz)
AC detector noise*<25 fm/√(Hz) above 100 kHz
Approach10 mm motorized, parallel
(*) measured with a USC-F1.2-k7.3 cantilever
CX Controller specifications 
High resolution outputs (DAC)12x 28 bit, 1 MHz/sampling; thereof 4x user DAC (optional)
Fast outputs (DAC)4x 16 bit, 100 MHz/sampling; thereof 1x user DAC (optional)
High resolution inputs (ADC)12x 20 bit, 1 MHz/sampling; thereof 4x user ADC (optional)
Fast inputs (ADC)3x 16 bit, 100 MHz/sampling; thereof 1x user ADC (optional)
Signal analyzers2 signal analyzer function blocks that can be configured as dual channel lock-in
FPGA module and embedded processorSystem-on-chip module with low-latency FPGA signal processing at 100MHz and dual-core ARM processor, 2GB RAM, 1.5GHz clock
Scan control28-bit X/Y/Z-DAC
Detector inputsDeflection/lateral signals each 20 bit
Digital sync, Spike-Guard2-bit line/frame sync out 5 V/TTL galvanically isolated, Spike-Guard input
Clock sync10MHz/3V clock input to synchronize data acquisition and processing
Communication to PCGigabit Ethernet, galvanically isolated


電話(huà):

13816692140

傳真:

021-55127698

郵箱:

naganano@163.com

地址:

上海市虹口區天寶路578號703室